Unlike Scanning Electron Microscopy that bounces electrons off the surface of a sample to produce an image, Transmission Electron Microscopes (TEMs) shoot the electrons completely through the sample.

The FIB uses a variation on the Everhart-Thornley (ET) secondary electron detector. Secondary ions are also produced in the beam-specimen volume and can be used for imaging; however, the Hitachi ...

AES operates on the principle of the Auger effect, named after the French physicist Pierre Auger. When a material's surface is bombarded with a beam of high-energy electrons or photons, it causes the ...

It may not have won an Oscar, but the tiny electron has finally made its film debut. A new video shows how an electron rides on a light wave after just having been pulled away from an atom. This is ...

Carbon nanotube field emitters are at present the brightest available electron sources but must operate at low currents to avoid Coulomb expansion and are therefore not suitable for ultrafast imaging.

What you’re looking at is the first direct observation of an atom’s electron orbital — an atom’s actual wave function! To capture the image, researchers utilized a new quantum microscope — an ...

image: The metallic tip of a scanning tunneling microscope drives the magnetic quantum state of an iron atom into a different direction while injected electrons destroy this state superposition. This ...

(Nanowerk News) A novel technique that nudges single atoms to switch places within an atomically thin material could bring scientists another step closer to realizing theoretical physicist Richard ...